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Nano

Coherent LMC Newprice 20-19-10 01 rev2.pdf

Coherent LMC Newprice 20-19-10 01 rev2.pdf

…RS 150
HD
(<10s), /
RS232
RoHS 1295923 498,000 29
PowerMax-Pro USB 150
HD Nano
/USB RoHS 1330510 498,000 29
PowerMax-Pro RS 150
HD Nano
/RS232 RoHS 1330545 498,000 29
PowerMax-Pro USB
150F HD
(<10s), USB

RoHS 1295920…

PowerMax-Pro USB/RS Sensors

PowerMax-Pro USB/RS Sensors

…laser pulse shapes resulting in improved laser characterization and process control. Specifications PowerMax-Pro USB/RS 150 HD 150 HD Nano 150F HD 150F HD Nano 150 BB 150F BB HP 2K Wavelength Range 400 nm to 1100 nm; 9 μm to 11 μm 400 nm to 1100 nm; 9 μm to 11 μm 400 nm to 1100 nm; 9 μm to 11 μm…

PowerLine Pico Series Marking Laser

PowerLine Pico Series Marking Laser

--> PowerLine Pico Series Marking Laser The sub-nano second lasers from the PowerLine Pico series offer outstanding processing quality at high speed, making them ideal for delicate marking of sensitive materials used in the semiconductor and medical sector, and micromachining applications such as…

SureBlock™ XLF Notch Filter Systems

SureBlock™ XLF Notch Filter Systems

…observation of low-frequency vibrational/phonon modes, differentiation of polymorphs, and other structural characteristics of pharmaceuticals, nano- and bio-materials; trace detection and forensics analysis of explosives and chemical/biological threat agents; and characterization of industrial,…

Marking Lasers

Marking Lasers

--> Marking Lasers Our marking lasers allow cost-effective marking solutions with excellent results ensuring maximum operating efficiency in the long run. We offer an unparalleled laser product portfolio, comprising 1064 nm, 532 nm and 355 nm wavelength laser markers as well as various technologies…

Microelectronics

Microelectronics

--> Wafer and Reticle Inspection - DPSS, ion and optically pumped semiconductor lasers enable front-end semiconductor manufacturing. In front-end semiconductor manufacturing, lasers are mainly used in two applications: in lithography tools and in inspection. There are many different inspection steps…

coherent lmc newprice 20-19-04 01.pdf

coherent lmc newprice 20-19-04 01.pdf

…PowerMax-Pro RS 150 HD (<10s), /
RS232
RoHS 1295923 498,000 29
PowerMax-Pro USB 150
HD Nano
/USB RoHS 1330510 498,000 29
PowerMax-Pro RS 150 HD
Nano
/RS232 RoHS 1330545 498,000 29
PowerMax-Pro USB 150F
HD
(<10s), USB

RoHS 1295920…

coherent lmc newprice 20-18-10 01.pdf

coherent lmc newprice 20-18-10 01.pdf

…PowerMax-Pro RS 150
HD
(<10s), /RS232

RoHS 1295923 498,000 29
PowerMax-Pro USB 150
HD Nano
/USB RoHS 1330510 498,000 29
PowerMax-Pro RS 150
HD Nano
/RS232 RoHS 1330545 498,000 29
PowerMax-Pro USB
150F HD
(<10s), USB

RoHS 1295920…

Coherent LMC Newprice 20-19-10 01.pdf

Coherent LMC Newprice 20-19-10 01.pdf

…RS 150
HD
(<10s), /
RS232
RoHS 1295923 498,000 29
PowerMax-Pro USB 150
HD Nano
/USB RoHS 1330510 498,000 29
PowerMax-Pro RS 150
HD Nano
/RS232 RoHS 1330545 498,000 29
PowerMax-Pro USB
150F HD
(<10s), USB

RoHS 1295920…

Ondax - Layer Properties App Sheet New Preview v2

Ondax - Layer Properties App Sheet New Preview v2

…Fig. 1 Generalized chemical structure of TMDs, showing the metal (grey) and chalcogenide (yellow) atoms , adapted from S. Mouri, K. Matsuda et al., Nano Lett. 13, (2013) 5944 (Top). Optical Micrographs (100x) of two layer MoSe 2 substrates. Red dot indicates the approximate location of the Raman…

Quotation KML QGYYMMDD G  Institute Contact

Quotation KML QGYYMMDD G Institute Contact

…include metrology for EUV lithography, spectroscopy, microscopy,[2] and dynamic studies of molecular, [3] magnetic,[4,5] material,[6] and nano systems.[7,8] Depending on application requirements, HHG source characteristics can be tailored to obtain attosecond time resolution or energy/spectral…

mephisto MOPA whitepaper v05.pdf

mephisto MOPA whitepaper v05.pdf

…by classical computing.
Laser Source Requirements
As the experiments discussed above are dealing with atoms in temperatures of micro to nano
Kelvin, they are extremely sensitive to any noise sources which ultimately limit the resolution of
the experiment or the measurement time.…